Abstract
In this paper suspended microstrip lines are studied for their dispersion characteristics using Galerkin Technique in Spectral Domain. Basis functions for the unknown strip current are chosen according to the geometry of the structure of the line. For theoretical analysis, Fourier transform of the basic functions from space domain to spectral domain are considered. The line is analyzed for dispersion characteristics in the X-band corresponding to different values of the thickness of the suspended dielectric substrate and also studied for the different values of the relative permittivity of the substrate.
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Schedule a callMore From: IOP Conf. Series: Materials Science and Engineering
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