Abstract
A reaction with oxygen during oxygen exposure to Cerium metal surface under ultra high vacuum condition and depth profiling on formed Cerium oxide layer were investigated in term of chemical state analysis by Auger electron spectroscopy (AES) and by factor analysis. Principal component analysis (PCA) on Ce NON Auger spectra suggested that three physically meaningful components existed from the analyzed data in both cases. After the PCA, three spectra were extracted from the data and these showed significant peak shape changes in each spectrum which were corresponding to different chemical states. In addition, the profiles constructed by factor analysis showed the chemical state changes on the Cerium metal surface during oxidation or chemical depth distributions in the oxide layer.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
