Abstract
The aim of the present study is to offer results of reliability, availability, maintainability and dependability analysis of a microprocessor system. A microprocessor is designed with the help of seven subsystems including input, terminal, processor, main memory disk, addressing modes, disk controller and disk drives. Reliability, availability, maintainability and dependability analysis has been performed for all the subsystems. For analysis purpose, state transition diagram has been designed for all subsystems and using Markov birth–death process governing equations has been derived. All random variables are exponentially distributed, i.e., follows constant failure rate. Mean time between failures, mean time to repair, availability, reliability, maintainability and dependability ratio parameters for all the subsystems are computed. The reliability and maintainability are estimated at various time instants.
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