Abstract
We have studied the matrix change dependence of the positive (Cs +) and negative (I −) secondary ion intensities from an overlayer of ionic compounds (CsI) on an Au surface by TOF-SIMS. The change of the ion yield ratio of the positive to the negative is almost insignificant even if the coverage of the overlayer on Au changes from submonolayer (< 1 ML) to thick film ( > 10 ML). To interpret this phenomenon, tunneling and bond breaking models are applied. These results have led to the conclusion that the bond breaking model is suitable for an explanation of the secondary ionization probability of each of the positive and negative secondary ions for both submonolayer and thick ionic compounds (CsI) on an Au surface.
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