Abstract

ABSTRACTVibrational Raman scattering has been used in conjunction with luminescence, luminescence excitation spectroscopy, and x-ray diffraction to study the interfaces of GaAs/AlAs superlattices grown by MBE with and without growth interruptions at the interfaces. The confined LO phonon spectra clearly indicate that in the sample grown with growth interrupts at least one of the interfaces in each GaAs layer is truly smooth. In addition it is shown that the intensity of the interface phonons probed via Raman scattering is sensitive to the state of the interface.

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