Abstract
This chapter is an introductory chapter which presents overviews of the main methods in analyzing, producing, and characterizing functional materials. A brief idea about deducing optical properties from dielectric function using Kramers–Kronig relations is presented, with BexZn1−xTe alloys as an example. The reflectance, transmittance, real and imaginary parts of the dielectric function, refactive index, extinction coefficient, absorption coefficient, and loss function of these alloys are plotted against energy and discussed. Brief ideas about some growth techniques of single crystals such as Bridgman, Czochralski, and Kyropoulos are overviewed. Besides, some deposition methods of films are described. These include molecular beam epitaxy (MBE), metal–organic chemical vapor deposition (MOCVD), and chemical vapor deposition (CVD). Moreover, the main characterization techniques X-ray diffraction (XRD), X-Ray reflectivity (XRR), scanning electron microscopy (SEM), X-ray fluorescence (XRF), small and wide-angle X-ray scattering (SAXS and WAXS), secondary ion mass spectroscopy (SIMS), atomic force microscopy (AFM), spectroscopic elipsometry (SE), photoluminescence spectroscopy, Fourier transform infrared spectroscopy (FTIR), Raman Spectroscopy, UV-Vis spectroscopy, and others are briefly described, and some examples are presented.
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