Abstract
An instrument to remotely measure small movements in ion implanted materials is described. The system, comprising a Michelson interferometer, light intensity digitiser and computer interface allows fast tracking and large scale data storage. The system has been used to investigate strains in proton irradiated quartz while the irradiation is occurring.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
