Abstract
Generating compact dynamic thermal models is a key issue in the thermal characterization of packages. A further but related problem is the modeling of the thermal coupling between chip locations, for the use in electro-thermal circuit simulators. The paper presents a measurement based method which provides a way to solve both problems. A thermal benchmark chip has been designed and realized, to facilitate thermal transient measurements. The developed evaluation method provides the compact thermal multiport model of the IC chip including package effects, for the accurate electro-thermal simulation of the ICs. The evaluation method is also suitable to generate the compact thermal model of the package.
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