Abstract
SUMMARYCombined scanning transmission electron microscopy (STEM) and X‐ray microanalysis have been used to detect the equilibrium segregation of bismuth to grain boundaries in copper. Quantification of the X‐ray data gives grain boundary bismuth concentrations close to those reported previously by Auger electron spectroscopy (AES). Samples tempered at low temperatures (773,873 K) had detectable bismuth concentrations at more boundaries than those samples tempered at high temperature (1073 K). There is evidence that the degree of segregation varies strongly from boundary to boundary.
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