Abstract
We present a statistical method to investigate the electronic transport of molecular devices. Electrical characterizations are performed with subsequent statistical analysis on 6745 molecular devices with nanometer-scale junction diameter. The comprehensive temperature-variable current-voltage measurements are also performed to elucidate the dominant charge conduction mechanism responsible for intrinsic molecular transport properties. The entity of data acquired represents a reliable basis for statistical analysis, which consequently provides an objective criterion to determine the most probable transport characteristics of molecular devices.
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