Abstract
A static capacitor is described for the measurement of contact potential change during the adsorption of gases on evaporated metal films. The method eliminates the need for vibrating or rotating parts in the cell structure, and enables rapid surface potential changes to be followed. The accuracy of all measurements is to better than 1%. The preparation and use of a new reference surface is also described. Studies of the exo-electron emission accompanying surface potential changes during chemisorption can be made using the same apparatus.
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