Abstract
A sort method is proposed to enhance the significant spectral components of test set. In the field of integrated circuit testing, to calculate significant spectral components, it's necessary to do spectrum analysis for the test set. In this paper, a bipartite graph and weight matrix are constructed based on the test set and its significant spectral components. Therefore, the problem of enhancement of significant spectrum components is transformed into a bipartite graph matching problem that can be solved by KM(Kuhn-Munkras) algorithm. After the order adjustment of the test set according to the matching relationship, the correlation between the significant component and test set has been increased, and the significant spectral components are enhanced. Finally, the experimental results on the test set of the ISCAS-89 benchmark circuits show that the coefficients of the sorted test have increased by 9.47% on average, and the incompatible bits between the test set and its significant spectral components have effectively reduced by 14.18% on average.
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