Abstract
AbstractApparent resistivity measurements with the square array technique in the vicinity of a dipping interface have the advantage over collinear array methods that they are less dependent on orientation of the array.In order to exploit this, existing potential solutions for the dipping interface problem have been adapted for the computation of apparent resistivities over such a feature using a square array.Comprehensive interpretation techniques covering this problem are given and the limitations imposed by residual array orientation effects are discussed.
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