Abstract

In this paper, a smart detector design for novel multi-plane ultrafast electron beam X-ray computed tomography is presented. The concept is based on multi-plane electron beam scanning on a transparent X-ray target and elongated cuboid-shape scintillation detectors for radiation detection over an extended axial scanning range. The optical part of the scintillation detector acts as both an X-ray sensitive scintillator with a fast time response and a light guide. With that, we reduce detector complexity, number of detector elements, overall power consumption, and detector costs. We investigated the performance of this new multi-plane detector design with an evaluation detector setup that is made of cerium doped lutetium yttrium oxyorthosilicate (LYSO:Ce) as scintillation material and an avalanche photodiode (APD) array. Thereby, we assessed two design variants: A monolithic LYSO bar detector and a sandwich detector made of multiple LYSO crystals and glass light-guides. Both types reveal excellent linear detector responses, long-term stabilities, and comparable signal qualities.

Highlights

  • X-ray tomography, which is known from medical diagnostics and non-destructive testing, is increasingly employed to study problems of fluid flow and process engineering [1,2,3,4,5]

  • We propose and evaluate two novel detector designs that use only a single-pixel detector whose scintillation material is elongated over detector designs that use only a single-pixel detector whose scintillation material is elongated over multiple planes—the so-called multi-plane detector (MPD) design

  • The paper presents the basic concept of the multi-plane scanning approach (MP-ultrafast electron beam X-ray computed tomography (UFXCT)) that uses the novel multi-plane detectors

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Summary

A Smart Multi-Plane Detector Design for Ultrafast

André Bieberle 1, * , Dominic Windisch 1,2 , Kerolos Iskander 1 , Martina Bieberle 1 and Uwe Hampel 1,2. Chair of Imaging Techniques in Energy and Process Engineering, Technische Universität Dresden, 01062 Dresden, Germany. Received: 6 August 2020; Accepted: 4 September 2020; Published: 10 September 2020

Introduction
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Principle of Multi-Plane Detectors for UFXCT Imaging
Its cut-off trans-impedance stage for biased photodiodes is shown in Figure
Procedure
Detector Signal Analysis
Performance at Various
Conclusions
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