A Simulative Measuring Model of Scanning Near-Field Optical Microscope by Applying Aluminum Atoms of FCC Structure for the Nano-Scale Standard Sample and the Qualitative Analysis

Abstract

During the measurement by scanning near-field optical microscope (SNOM), it is found that edge effect is prone to occur. This paper uses the aluminum (Al) atoms of FCC structure to arrange the atomic model of the measurement of SNOM, and use Morse potential to calculate the tip-sample atomic interaction, and combines the vibration theory for the optical fiber tip, to construct a fixed amplitude simulative model for measuring SNOM. And according to this simulation measure obtained result. It implies that a sharper probe can produce fewer effects on the edge effect. In the comparison between the result of simulative measurement and that of real scanning and measurement, it is proved that the simulative measuring model for the nano-scale standard sample of SNOM constructed by this paper is reasonable.