A simplified procedure for obtaining relative x-ray intensities when a texture and atomic displacements are present

Abstract

The orientation problem in polycrystalline cubic materials has been simplified, using fundamental relationships, so that the determination of a quantitative interrelationship between the various Bragg peak intensities is no longer a formidable task. This is demonstrated with a cubic Cu-Be-Co alloy having a fiber texture, and a conventional focusing diffractometer. Because data are required which extend over a larger range in d spacings, extinction, thermal, and static atomic displacements must be included into the analysis of intensities. The displacement terms and the extinction parameters may be of primary interest or used as a correction. Seventeen diffraction peaks are used in the example. These must be internally consistent with a crystallite orientation function, the cubic symmetry of the sample, extinction effects influencing the two strongest peaks, and attenuation due to atomic displacements. Tabulated coefficients are presented which greatly reduce the task of calculating the orientation function. A correction is given for instrumental smearing which should be considered for stronger textures than the intermediate case examined or for intermediate textures and nonfocusing instrumental conditions.