Abstract
The technique is based on the detection of the recalescence at two opposite points on the surface of a levitated melt by means of photo-diodes. Nucleation is externally triggered within the field of view of one detector, so that the dendritic growth rate is given by dividing the specimen diameter by the delay time between the two diode signals. In pure element melts the undercooling can be determined directly from the photo-diode signals, providing a high time resolution for the temperature measurement. The technique was first tested on Ni melts, since comparable results are available from the literature. Dendritic growth rates were then measured in undercooled Ti melts. The results are discussed in the light of dendritic growth theories.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.