Abstract
This article proposes the improved method for detecting (diagnosing) stuck-at-faults (0/1) in PIPO-type digital combinational circuits described by a system of logical functions. Compared to already known methods and algorithms, the presented approach is characterized by a simpler implementation of the search for vectors of the test codes for detection of such malfunctions at arbitrary points of a logic circuit with many outputs due to the usage of several simple numerical set-theoretic operations and procedures. The given examples prove the advantages of the proposed method.
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