A simple soft X-ray (1 < λ < 11 nm) spectrometer for relative line intensity measurements in charge exchange studies

Abstract

We describe a simple plane crystal spectrometer specially built for charge exchange study through soft X-ray deexcitation of highly charged ions. The use of low energy, highly charged ions incident on He and H 2 targets decreases the number of processes leading to photon emission. Thus, the X-ray spectra are simple and we demonstrate that a moderate resolution spectrometer is sufficient. The instrumental relative sensitivity has been measured in the 1 to 11 nm wavelength range and a good agreement has been found with calculated values. Using the “linear mix” deconvolution procedure described by Henke, we made accurate measurements for the X-ray transition intensities in N 7+, O 8+, Ne 8+ -He, H 2 collision cases.