Abstract
A simple scanning mechanism is described for the X-ray investigation of preferred orientation in coarse-grained wires, by means of which the spottiness normally present in the diffraction patterns from such specimens is transformed into smooth variations of intensity on the Debye-Scherrer rings. The device is attached to a Unicam single-crystal goniometer and permits the non-repetitive scanning of a continuously rotating specimen. In its present form specimen lengths of about 5 mm can be scanned.
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