Abstract
A new simple and fast procedure to calculate the dielectric properties of materials without ambiguity has been developed by transforming one-port reflection measurements, made by an automatic network analyzer, into permittivity values. The measurements needed for the dielectric characterization are taken from two samples of different lengths embedded inside two short-circuited waveguides with a length relation of 1:n. The technique is validated by good agreement with previously reported results. © 2000 John Wiley & Sons, Inc. Microwave Opt Technol Lett 25: 191–194, 2000.
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