Abstract

We present a simple analytical model that describes ion transport in a planar junction between an electrolyte and a conducting polymer film. When ions are injected in the film, holes recede, leading to partial dedoping of the film. This is modeled by two resistors in series, an ionic one for the dedoped part and an electronic one for the still-doped part. We show that analytical predictions can be made for the temporal evolution of the drift length of ions and the current, variables that could be assessed experimentally. A numerical model based on forward time iteration of drift/diffusion equations is used to validate these predictions. Using realistic materials parameters, we find that the analytical model can be used to obtain the ion drift mobility in the film, and as such, it might be useful towards the development of structure vs. ion transport properties relationships in this important class of electronic materials.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call