Abstract
We present a simple method of simultaneous measuring of the refractive index and dispersion for transparent materials over a wide wavelength region from 430nm to 660nm. It is mainly composed of the broadband illuminating source of stable incident light intensity and spectrometer with CCD detector. In order to verify a reliable and appropriate performance of measurements of the present method, sapphire and K9 glass were used as the samples to test the method. The measuring results show that present method is in agreement with the minimum deviation method. It validates the feasibility of present technique.
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