A Simple Method for Fabrication of Self‐sharpened Silicon Tips for Atomic Force Microscopy Applications (Crystal Research and Technology 6/2022)

Abstract

Crystal Research and TechnologyVolume 57, Issue 6 2270011 Cover PictureFree Access A Simple Method for Fabrication of Self-sharpened Silicon Tips for Atomic Force Microscopy Applications (Crystal Research and Technology 6/2022) First published: 09 June 2022 https://doi.org/10.1002/crat.202270011AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinked InRedditWechat Abstract In article number 2100217, Savitha Purakkat, Basavaraju Yeriyur Basavaiah, and co-workers present a simple and high yield method to bulk produce self-sharpened silicon tips using cost-effective chemicals. The generated silicon tips are successfully adopted to fabricate atomic force microscopy probes. After installing in a commercial atomic force microscope, the developed probes produce the images of quality and accuracy of those obtained with commercially available probes. Volume57, Issue6June 20222270011 RelatedInformation