Abstract
An unique method based on atomic force microscopy (AFM) and resonance for accurately characterizing elastic modulus of nanowire (NW) arrays in atmospheric environment is demonstrated without destructing or manipulating the sample. By acquiring the topography images of the NW arrays under frequency tunable AC electric field through AFM noncontact scanning mode, the resonance frequency of NWs can be easily identified and elastic modulus of the NW arrays is further derived. The measurement mechanism is based on quantifying the AFM tip scanning depth in the spaces of NWs to achieve the information of vibration. For the first time, the elastic modulus of ZnO NWs synthesized by of hydrothermal method is measured to be 55.7 ± 8.3 GPa.
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