Abstract
Double-walled carbon nanotubes (DWNTs) are potential candidates for new generation of on chip interconnections due to their nearly metallic behaviour. For such large scale integration purpose it is mandatory to characterize their electrical properties in a statistical way. We thus propose a new methodology for characterizing in one step, the electrical properties of a large population of nanotubes. The method enables to obtain histograms of the conductance and maximum current density of individual nano-objects.
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