Abstract

In order to observe anisotropically grown crystalline materials perpendicular to a certain preferred orientation, a standard cross-sectional TEM preparation method has been modified. The material is embedded in an organic epoxy resins between two Si-wafers. Plates, needles and tubes lay flat inside the resulting sandwich, which is then cut into slices perpendicular to the wafers. The slices are thinned by mechanical abrading and, finally, by ion milling. Crystals located near the central hole are electron-transparent, and their orientation often allows for an observation along the desired direction. The usefulness of this procedure is demonstrated on the examples of HT c superconductors and vanadium oxide nanotubes.

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