Abstract

AbstractTo verify the availability of porous silicon (PS) device for application to optical switching, the photonic response of PS for carrier injection has been studied for a microcavity configuration. The observed reflectance spectral shift in the PS microcavity with increasing diode current is analyzedunder the assumption that the refractive index of nanocrystalline silicon is increased by carrier injectionand the subsequent accumulation possibly in localized states. This is consistent with the experimental results obtained from dynamic response measurements: there are fast and slow components in the refractive indexchange. It is also demonstrated that under the pulsed operation, the PS microcavity operates as a current-induced nonlinear optical switching device.

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