Abstract
We describe a semi-empirical method to correct experimental Compton profiles for the effect of multiple scattering which is applicable in those cases where it is possible to collect data on samples of more than one thickness. The method consists of calculating the total amount of multiple scattering for each sample thickness using the Monte-Carlo technique, followed by a linear extrapolation of each momentum point in the profiles to “zero multiple scattering”. The method is tested for experimental results on silicon and water measured with primary radiations of 412 and 60 keV, respectively.
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