Abstract
Ultrathin films of rutile TiO2(110) have been grown on a W(100)-O(2 × 1) surface and characterized with a combination of scanning tunneling microscopy (STM) and low-energy electron diffraction (LEED). LEED shows the presence of two orthogonal rotational domains of rutile TiO2(110). In line with this, STM images reveal that the rutile TiO2 grows as discrete islands and can be aligned in either of the principal directions of the underlying substrate W(100)-O(2 × 1). High-resolution STM images reveal atomic-scale rows and the presence of point defects on the rutile islands that are characteristic of the native rutile TiO2(110)-(1 × 1).
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