Abstract
We report on a microscopic technique employing locally excited surface-plasmon-polaritons (SPPs) as the sensing probe. The localized SPPs are excited by a focused laser beam on a metallic surface and the Fourier spectrum of the reflected light is observed in order to measure the propagation constant of the excited SPPs. By using the well-known relationship between the propagation constant of SPP and the refractive-index of a sample deposited onto the metal surface, we determine the local refractive-index. We develop a sample scanning microscope based on this concept and observe dispersed micro-particles on a silver surface. Our experimental results show 1.5 μm or better resolution, which has been not achieved before.
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