Abstract
A scanning interferometric method for studying inhomogeneous deformations of thin plates of dielectric crystals under the action of a homogeneous electric field (converse flexoelectric effect) is proposed. The results of using this method to determine the type and magnitude of inhomogeneous deformations (spherical and cylindrical bending deformations) with an accuracy of up to 10 nm in model perovskite ferroelectric single crystals and related materials are demonstrated.
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