Abstract
We present a study of the surface oxide layer of industrially air-produced FeCrPCSi amorphous ribbons. Ion bombardment assisted-SAM (Scanning Auger Microprobe) was used to characterize the layer. It was found that the free side surface layer is heterogeneous and consists of (silicon, titanium) rich oxide tiles embedded in an iron oxide matrix, whereas the wheel layer was evaluated for both sides of the of iron oxide. Using depth profiling, the thickness of the surface layer was evaluated for both sides of the ribbons, including the tiles. It was shown that it was less than 30 nm everywhere.
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