Abstract

Metallurgical‐grade silicon, used as a substrate material for low‐cost epitaxial solar cells, purified by the heat‐exchange method leaves some metallic particulate residue in the purified ingots. Scanning Auger electron spectroscopy has been used to elementally identify the particulate residue exposed in sections from purified ingots. Particle composition (V, Ti, Ni, Fe, Al, and C rich silicon) was found to be position sensitive within an ingot and to depend on the source of MG feedstock.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.