Abstract
The gelation process of silicon ethoxide and titanium iso-propoxide solutions was studied as a function of water content and reaction time by small-angle X-ray scattering (SAXS). Approaching the gelation points, the SAXS intensities for titanium tetra-iso-propoxide solutions start to follow a power-law decay in the Porod region, except for a H 2O/Ti ratio greater than 4. For silicon ethoxide solutions, the fractal dimension, d f, measured for aggregated clusters increases continually with the H 2O/Si ratio and can be related to the spinnability of the solutions. For solutions of both silicon and titanium alkoxides, a solution of fractal dimension d f < 1.79 shows spinnability, whereas solutions having d f > 1.79 and no fractal structures do not show spinnability.
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