Abstract
A simple sample holder has been developed for the K‐alpha and Nexsa range of X‐ray photoelectron spectroscopy instruments that allows for the rapid throughput analysis of the ball sections of mini‐traction machine, the analysis of which can be useful in understanding of, for example, surface scuffing and other phenomena in mini‐traction machine instruments.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
