Abstract

A ruggedness improved multi-band radio frequency (RF) power amplifier (PA) module applicable to mobile handsets, which are required to survive against a serious load impedance change under extreme power and bias conditions, is presented. In this method, the load impedance of PA is adaptively adjusted with a digitally controlled impedance corrector to keep the PA safe by performing a load mismatch detection. The impedance mismatch detector, impedance corrector, and other RF switches were all integrated into a single integrated circuit (IC) using silicon on insulator (SOI) complementary metal oxide semiconductor (CMOS). For the verification purpose, a 2-stage hetero junction bipolar transistor (HBT) PA module adopting this method was fabricated. At a frequency of 1915 MHz, a collector bias voltage of 4.2 V, and over a wider range of load impedance variation between a VSWR of 1 and a VSWR of 5.5, it did not fail. When this technique was not applied with a voltage standing wave ratio (VSWR) range of 1 to 4, it resulted in an acceptable RF performance degradation of 1% power added efficiency (PAE) in envelope tracking (ET) mode. Moreover, it survived at a bias voltage 1V larger than when the technique was not applied for the same mismatch condition.

Highlights

  • Since the radio frequency (RF) power amplifier (PA) in a mobile device are connected to an antenna, they must go through impedance mismatches caused by environmental changes

  • Since the RF PAs in a mobile device are connected to an antenna, they must go through impedance mismatches caused by environmental changes

  • This paper presents a ruggedness improvement method for mobile RF PAs using a dynamic load particular failure issue

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Summary

Introduction

Since the RF PAs in a mobile device are connected to an antenna, they must go through impedance mismatches caused by environmental changes. The PA can be damaged when a load mismatch occurs, the PA’s ruggedness was a main concern for Tx chain in mobile handsets For this reason, many efforts were made to improve it and solutions for sufficient ruggedness were provided [1,2,3,4,5,6,7,8,9,10,11,12,13], including: Clamping circuit [1,2,3], resistive emitter ballasting [4], closed loop protection technique [1,5,6,7,8,9,10], high voltage process, and so on. 3 dB.can be increased more than 5 V with boosting technique

V with boosting
The Failure Mechanism in an HBT RF PA under a Mismatch
Operating Principle of Protection
Impedance
Dynamic Impedance Corrector
Experimental Verification
MHz resource
Findings
Conclusions
Full Text
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