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Abstract
In this paper, we propose a novel method to treat thin conductive (TC) sheets of arbitrary three-dimensional (3-D) shape and curvature with the electromagnetic (EM) finite-difference time-domain (FDTD) algorithm without the need to resolve the sheet thickness spatially. We show that the physical properties of TC sheets enable us to do so without introducing additional field components to the conventional Yee scheme. Due to this noninvasive approach, in addition to the preserved stability of the FDTD algorithm, the method can be directly applied to any existing FDTD kernel, such as parallelized or hardware accelerated versions. The method has been developed within the framework of a professional EM FDTD software package and tested on real-world problems.
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