Abstract
Historically, the development of XRF spectrometers has followed 2 main paths which are characterized by the means of spectral resolution they use. Those employing diffraction crystals and Braggs law to disperse the X-ray wavelengths are known as wavelength dispersive (WDX), whilst those usinq only the energy resolution of the detector, as enerqy dispersive (EDX). In the past these two have not normally been directly compared, because the WDX systems have always been the more expensive.
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