Abstract

Summary form only given. The authors present the theory underlying probe-corrected near-field antenna measurements from which the far-field gain, pattern, and polarization may be determined. This theory allows for the rigorous compensation for the effect of a probe which does not measure the field at a point, but rather from an average over the aperture of the probe weighted by the characteristics of the probe. By application of the sampling theorem in the analysis, very efficient algorithms based in large part on the fast Fourier transform (FFT) may be employed in the analysis of the data without introducing approximations in the evaluation of the integrals arising in the analysis. >

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