Abstract

.A restricted solid-on-solid growth model is studied in higher dimensions with a proper restriction parameter. The interface width W(t) is measured as a function of time t and the growth exponent β is estimated through the relation W(t) ∼ tβ on various dimensions from d = 5 + 1 to d = 11 + 1. Also, the roughness exponent α is obtained from the saturated interface width for both d = 5 + 1 and d = 6 + 1. Our numerical simulation results indicate that the upper critical dimension of the Kardar–Parisi–Zhang equation should be larger than d = 11 + 1.

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