A Reflection Measurement System With High Accuracy Using Binary Coded Signals

Abstract

The measurement of the electromagnetic reflection characteristics of a device under test (DUT) is of interest in a large variety of applications. For this task, the established low-cost approach of using pulse-shaped excitation signals is more and more replaced by employing continuous binary coded excitation signals. The reason behind this is that reflection measurement systems with continuous signals offer a larger signal-to-noise ratio (SNR), which allows for a larger dynamic range compared to pulsed systems for the same measurement time. However, a correlator is needed to access the impulse response function (IRF) of the DUT. In this contribution, a reflection measurement system is presented using a hybrid correlation approach. In the latter, the correlation is performed using a combination of a hardware and a software correlator. The hardware of the developed measurement system has been optimized to achieve a high dynamic range and a high measurement accuracy. A demonstrator system has been realized using the so-called almost perfect auto-correlation sequences (APASs) with a chip clock of 5Gchips/s. With the optimized hardware, a dynamic range of 82 dB has been achieved. The measurement accuracy has been validated by means of distance measurements versus a high accuracy laser reference system achieving a maximum error of 25 ${\mu }\text{m}$ . Furthermore, the measured reflection coefficient of a low-pass filter has been compared with the results obtained with a vector network analyzer (VNA).