Abstract
A novel reflected terahertz-emission microscopy is proposed anddeveloped for improving the spatial resolution of THz imaging. Whenattaching a bow-tie antenna directly onto a thin generation crystal,the reflected THz waves can be collected and detected by aphotoconductive antenna, and the spatial resolution is decided by thediameter of focused pump beam. In this way, the detected resolution canbe largely improved and tunable. The configuration and characteristicsof this microscopy are described in detail.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Paper version not known
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
