Abstract
A simple optical method for determination of thicknesses of organic layers on solid substrates is described. The method is based on the use of a substrate with a high refractive index, e.g., silicon, and reflection of light at an angle of incidence close to the pseudo-Brewster angle. Under these conditions, a reflectance minimum is obtained for light polarized in the plane of incidence. The presence of an organic layer on the surface will increase the reflectance, which is used to determine the thickness of the layer. The physical basis of the method is described briefly, and the application to immunology is demonstrated.
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