Abstract

We have developed and routinely used a reel-to-reel (R2R) scanning Hall-probe microscopy (SHPM) system to characterize REBCO conductors developed at the University of Houston. By mapping the screening-current-induced field of a magnetized REBCO conductor, the SHPM system enables 2-dimensional imaging of critical current density (<i>J</i><sub>c</sub>) distribution in a contact-free, non-destructive approach. Most existing SHPM systems investigate the magnetized REBCO conductors at remnant state without external background field. However, because of the inhomogeneity in the distribution of nanoscale artificial pinning centers in advanced REBCO conductors, there is a demand for reel-to-reel in-field examination over long conductor lengths. We have been developing a new R2R SHPM, capable of measuring the <i>J</i><sub>c</sub> profile of long REBCO conductors at the temperature of 63.5&#x2013;77 K and in an applied field up to 5 T. With optimal data acquisition and processing techniques, we overcame the challenge of measuring weak screening-current-field signals in a strong background field. R2R <i>J</i><sub>c</sub> mapping has been performed on long REBCO conductors with a spatial resolution as low as 0.15 mm<sup>2</sup> and a longitudinal scanning speed comparable with our existing system. Our previous study revealed a good correlation between the REBCO conductors&#x2019; 65-K in-field <i>J</i><sub>c</sub> and their <i>J</i><sub>c</sub> over a wide span of temperatures and fields. Using this correlation, the in-field R2R SHPM will serve not only as a means of quality control, but also provide insight into high-field performance of advanced REBCO conductors at low temperatures.

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