Abstract
An electron beam position and angle monitoring system, ps-BPM, has been shown to be able to measure the electron source position and angle at a single location in a beamline at a synchrotron source. This system uses a monochromator to prepare a photon beam whose energy is at that of the K-edge of an absorber filter. The divergence of the beam from the source gives an energy range that will encompass the K-edge of the filter. A measurement of the centre of the monochromatic beam and the K-edge location through the absorber filter gives the position and angle of the electron source. Here, it is shown that this system is also capable of measuring the source size and divergence at the same time. This capability is validated by measurement as the beam size in the storage ring was changed and by ray-tracing simulations. The system operates by measuring the photon beam spatial distribution as well as a K-edge filtered beam distribution. These additional measurements result in the ability to also determine the electron source size and divergence.
Highlights
The emittance of the electron beam is a fundamental property of synchrotron sources as it describes the area of the transverse phase space of the electron source (Buon, 1992)
Measurements were performed during special operation shifts at the Canadian Light Source (CLS) while the size of the electron beam was changed by altering the vertical–horizontal coupling using different currents in skew quads
The data were compared with measurements recorded with a 30 mm pinhole camera at a diagnostic BM beamline, X-ray Synchrotron Radiation (XSR) (Bergstrom & Vogt, 2008)
Summary
The emittance of the electron beam is a fundamental property of synchrotron sources as it describes the area of the transverse phase space of the electron source (product of the size and divergence) (Buon, 1992). Measuring the electron source size and divergence is important and becoming ever more critical as the generation of light sources are being planned and built (Eriksson et al, 2014; Tavares et al, 2014), such as implementing a multi-bend achromat (MBA) lattice (Einfeld et al, 2014). These new machines are focusing on achieving the smallest possible emittance ideally below the emittance of the photon radiation to deliver a diffractionlimited beam. There are different ways of measuring source size, which can be categorized as direct imaging and diffraction-based techniques
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