Abstract
AbstractThis paper describes a computer method for wavelength dispersive (WD) qualitative X-ray fluorescence (XRF) analysis. It determines the elements, spectral lines, wavelengths, reflection angles and peak intensities of the first and second order reflections in less than half a minute of time using an IBM Series/1 minicomputer. The resolution and precision are significantly better than the energy dispersive (ED) method and when combined with high speed computer recording the speed is comparable.
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