Abstract
The initial search for X-ray reflexions from a single crystal on a four-circle diffractometer can conveniently be made in a random way, subject to restrictions on the positions generated. The reflexions thus found are usually well distributed over the region of reciprocal space investigated, and provide an excellent basis for orientation matrix and unit cell determination. With appropriate scan and reflexion centring techniques and a wide counter aperture, the method is fast, reliable and fully automatic.
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