Abstract
A qusioptical impedance measure ment on dielectric image line is proposed. This methode is con sists of measuring a tilt angle and a axial ratio of the ellipti cally polarized wave to be radiated from small coupling aperture. The usefulness of impedance measurements in the dielectric image line is proved at 35GHz band and also, it was shown to be well-suited at frequency above 100GHz.
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