Abstract
Two-phase microstructure calculated by Phase Field calculations is perturbed by Gaussian filtration processes to produce a series of deteriorated images. Fourier spectral analysis is, then, performed on the resultant images to derive information of spatial distribution of phases consisting of the microstructure. It is shown that Fourier spectrum is correlated with characteristic length involved in the microstructure. By inverting a particular spectrum peak, one can estimate the spatial distribution of a particular phase.
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